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Keysight Technologies 3458A Guide D'utilisation page 459

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SGL"
2740 OUTPUT 722;"OHM,1E5;NRDGS 8;TRIG SGL"
This is the same program as the Subprogram Display, but the DEFEAT function is
turned on. In this mode of operation, some of the overload detection and
protection circuitry is defeated. If a voltage of greater than 300 V is detected, the
defeat feature is turned off and the event is noted in the 3458A's memory. This
feature allows faster function and range changes but should not be, as a matter of
practice, abused.
Still faster
A considerable increase in throughput can be had if you use TRANSFER
statements instead of OUTPUT and ENTER statements. Further, the juxtaposition
of some commands improve the measurement speed. Notably, the sequence for
DELAY and ACBAND when working with ACV can make a large difference in
execution speed. The proper sequence is:
DELAY <#>;ACBAND <#,#>;ACV <range>.
If you want to change the default settling times when you change a function,
always change the DELAY command first. It is also faster in many cases to remain
on one integration time rather than change. For example, to get 6 1/2 digits
resolution, the 3458A can be set to APER 10E-5 (100 µs), where it can take almost
10,000 readings per second. If measurement calls for only a few measurements
with this resolution and a greater number with less resolution, it still may be faster
to leave the integration time at 100 µs and take all the measurements there. It
takes about 6 to 10 ms for the 3458A to change integration time. At about 10,000
readings per second, the 3458A can take one hundred 6 1/2 digit readings in that
time.
This last program uses transfers and the proper command sequence to achieve
the greatest possible throughput for the benchmark program.
Execution time = .360 s
Program Memory Download Time = .05 s
Reading Transfer time = .05 s
Keysight 3458A User's Guide
10 OPTION BASE 1
20 DIM Command$[1000] BUFFER
30 DIMA$[100],B$[100],C$[100],D$[100],E$(100],
F$[100],G$[100],H$[100],I$[100],Set_up$[100]
Optimizing Throughout and Reading Rate
D
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