Keysight Technologies 3458A Guide D'utilisation page 456

D Optimizing Throughout and Reading Rate
1750 OUTPUT 722;"DCV,10;NPLC 0;DELAY 0"
1760 FOR I=35 TO 37
1770 ENTER 722;A(I)
1780 NEXT I
1790 Exe_time=TIMEDATE-Exe_time
1800 Dnld_time=0
1810 Tns_time=0
1820 SUBEND
The test situation is the same as the situation with correct integration time, but
now the delay time is set to a value that will produce measurements to the desired
accuracy of each measurement instead of the default delays.
Using reading memory: (Subprogram Burst)
test execution time = 1.42 s
reading transfer time = .18 s
1830 SUB Burst(REAL Dnld_time,Exe_time,Tns_time)
1840 DIM A(37)
1850 Exe_time=TIMEDATE
1860 OUTPUT 722;"PRESET;MEM FIFO;MFORMAT SREAL
1870 OUTPUT 722;"OHM,1E4;NPLC 0;DELAY 0;NRDGS 15;TRIG SGL
1880 OUTPUT 722;"OHM,1E5;NRDGS 8;TRIG SGL
...
1940 OUTPUT 722;"DCV,10;NPLC 0;DELAY 0;NRDGS 3;TRIG SGL
1950 Exe_time=TIMEDATE-Exe_time
1960 Dnld_time=0
1970 Tns_time=TIMEDATE
1980 FOR I=1 TO 37
1990 ENTER 722;A(I)
2000 NEXT I
2010 Tns_time=TlMEDATE-Tns_time
2020 SUBEND
A marked change is effected in the structure of the program. Now the readings are
stored in Reading Memory as the measurements are made. At the end of the
measurement sequence, the readings are transferred from Reading Memory to the
computer using a FOR NEXT loop. Except for the convenience of data transfer,
there is no marked improvement in the speed of the measurement in this case. If
the data were transferred via a TRANSFER statement to the computer, there
would be more time savings.
456 Keysight 3458A User's Guide