BEHA UNITEST TELARIS Fi/RCD Mode D'emploi page 51

Table 6 Trip times for selective RCB´s with over curent protection
Fi/RCD-Type Current Type
IΔN
(RCBO)
(100mA/
300mA/
500mA/
1000mA)
Table 7 Trip times for impulse resistent RCB´s
Fi/RCD-Type Current Type
10mA/
30mA/
100mA/
300mA/
500mA/
1000mA
Current Type Test Current
IΔN IΔN
x0.5 0.5x
x1 1x
x2 2x
x5 5x
x0.5 0.35x
x1 1.4x
x2 2.8x
x5 7x
x0.5 0.5x
x1 1x
x2 2x
x5 5x
Current Type Test Current
IΔN IΔN
x0.5 0.5x
x1 1x
x2 2x
x5 5x
Ramp 0.4x- 1.4x
x0.5 0.35x
x1 1.4x
x2 2.8x
x5 7x
Ramp 0.1x- 1.4x
x0.5 0.5x
x1 1x
x2 2x
x5 5x
Ramp 0.1x- 1.4x
prescribed Test Time
Trip Time
- 500ms
130...500ms 500ms
60...200ms 200ms
50...150ms 150ms
- 500ms
130...500ms 500ms
60...200ms 200ms
50...150ms 150ms
- 500ms
130...500ms 500ms
60...200ms 200ms
50...150ms 150ms
prescribed Test Time
Trip Time
-
2000ms, IΔN≥100mA: 500ms
10...300ms 500ms
10...150ms 150ms
10...40ms 40ms
10...200ms 200ms
-
2000ms, IΔN≥100mA: 500ms
10...300ms 500ms
10...150ms 150ms
10...40ms 40ms
10...300ms 200ms
-
2000ms, IΔN≥100mA: 500ms
10...300ms 500ms
10...150ms 150ms
10...40ms 40ms
10...300ms 200ms
Technical Data
Standard Fi/RCD
Analyzer
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1 √
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
√
√
√
√
Standard Fi/RCD
Analyzer
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1 √
IEC61008-1 √
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
√
√
√
√
√
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